Logic-Path-and-Clock-Path-Aware At-Speed Scan Test Generation - researchr publication authors

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FuQiang Li, Xiaoqing Wen, Kohei Miyase, Stefan Holst, Seiji Kajihara. Logic-Path-and-Clock-Path-Aware At-Speed Scan Test Generation. IEICE Transactions, 99-A(12):2310-2319, 2016. [doi]

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