FuQiang Li, Xiaoqing Wen, Kohei Miyase, Stefan Holst, Seiji Kajihara. Logic-Path-and-Clock-Path-Aware At-Speed Scan Test Generation. IEICE Transactions, 99-A(12):2310-2319, 2016. [doi]
@article{LiWMHK16,
title = {Logic-Path-and-Clock-Path-Aware At-Speed Scan Test Generation},
author = {FuQiang Li and Xiaoqing Wen and Kohei Miyase and Stefan Holst and Seiji Kajihara},
year = {2016},
url = {http://search.ieice.org/bin/summary.php?id=e99-a_12_2310},
researchr = {https://researchr.org/publication/LiWMHK16},
cites = {0},
citedby = {0},
journal = {IEICE Transactions},
volume = {99-A},
number = {12},
pages = {2310-2319},
}