Xin Li, Fa Wang, Shupeng Sun, Chenjie Gu. Bayesian model fusion: a statistical framework for efficient pre-silicon validation and post-silicon tuning of complex analog and mixed-signal circuits. In Jörg Henkel, editor, The IEEE/ACM International Conference on Computer-Aided Design, ICCAD'13, San Jose, CA, USA, November 18-21, 2013. pages 795-802, IEEE/ACM, 2013. [doi]
Abstract is missing.