A highly reliable lightweight PUF circuit with temperature and voltage compensated for secure chip identification

Gang Li, Pengjun Wang, Yuejun Zhang. A highly reliable lightweight PUF circuit with temperature and voltage compensated for secure chip identification. In Yajie Qin, Zhiliang Hong, Ting-Ao Tang, editors, 12th IEEE International Conference on ASIC, ASICON 2017, Guiyang, China, October 25-28, 2017. pages 60-63, IEEE, 2017. [doi]

Authors

Gang Li

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Pengjun Wang

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Yuejun Zhang

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