A highly reliable lightweight PUF circuit with temperature and voltage compensated for secure chip identification

Gang Li, Pengjun Wang, Yuejun Zhang. A highly reliable lightweight PUF circuit with temperature and voltage compensated for secure chip identification. In Yajie Qin, Zhiliang Hong, Ting-Ao Tang, editors, 12th IEEE International Conference on ASIC, ASICON 2017, Guiyang, China, October 25-28, 2017. pages 60-63, IEEE, 2017. [doi]

@inproceedings{LiWZ17-13,
  title = {A highly reliable lightweight PUF circuit with temperature and voltage compensated for secure chip identification},
  author = {Gang Li and Pengjun Wang and Yuejun Zhang},
  year = {2017},
  doi = {10.1109/ASICON.2017.8252411},
  url = {https://doi.org/10.1109/ASICON.2017.8252411},
  researchr = {https://researchr.org/publication/LiWZ17-13},
  cites = {0},
  citedby = {0},
  pages = {60-63},
  booktitle = {12th IEEE International Conference on ASIC, ASICON 2017, Guiyang, China, October 25-28, 2017},
  editor = {Yajie Qin and Zhiliang Hong and Ting-Ao Tang},
  publisher = {IEEE},
  isbn = {978-1-5090-6625-4},
}