A Compact Hybrid MMC with DC Fault Ride-Through Capability

Yuwei Li, Yi Wang, Zhen Zhang, Yuhua Gao, Yixuan Yu, Sai Cao. A Compact Hybrid MMC with DC Fault Ride-Through Capability. In 49th Annual Conference of the IEEE Industrial Electronics Society, IECON 2023, Singapore, October 16-19, 2023. pages 1-6, IEEE, 2023. [doi]

Authors

Yuwei Li

This author has not been identified. Look up 'Yuwei Li' in Google

Yi Wang

This author has not been identified. Look up 'Yi Wang' in Google

Zhen Zhang

This author has not been identified. Look up 'Zhen Zhang' in Google

Yuhua Gao

This author has not been identified. Look up 'Yuhua Gao' in Google

Yixuan Yu

This author has not been identified. Look up 'Yixuan Yu' in Google

Sai Cao

This author has not been identified. Look up 'Sai Cao' in Google