A Compact Hybrid MMC with DC Fault Ride-Through Capability

Yuwei Li, Yi Wang, Zhen Zhang, Yuhua Gao, Yixuan Yu, Sai Cao. A Compact Hybrid MMC with DC Fault Ride-Through Capability. In 49th Annual Conference of the IEEE Industrial Electronics Society, IECON 2023, Singapore, October 16-19, 2023. pages 1-6, IEEE, 2023. [doi]

Abstract

Abstract is missing.