Yuwei Li, Yi Wang, Zhen Zhang, Yuhua Gao, Yixuan Yu, Sai Cao. A Compact Hybrid MMC with DC Fault Ride-Through Capability. In 49th Annual Conference of the IEEE Industrial Electronics Society, IECON 2023, Singapore, October 16-19, 2023. pages 1-6, IEEE, 2023. [doi]
@inproceedings{LiWZGYC23,
title = {A Compact Hybrid MMC with DC Fault Ride-Through Capability},
author = {Yuwei Li and Yi Wang and Zhen Zhang and Yuhua Gao and Yixuan Yu and Sai Cao},
year = {2023},
doi = {10.1109/IECON51785.2023.10312738},
url = {https://doi.org/10.1109/IECON51785.2023.10312738},
researchr = {https://researchr.org/publication/LiWZGYC23},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {49th Annual Conference of the IEEE Industrial Electronics Society, IECON 2023, Singapore, October 16-19, 2023},
publisher = {IEEE},
isbn = {979-8-3503-3182-0},
}