Ruitao Li, Xiaojun Wu, Jinghui Zhou, Jiarui Zheng. Fast and High Precision Surface Defect Detection Method Based on New Label Assignment. In IEEE International Conference on Real-time Computing and Robotics, RCAR 2023, Datong, China, July 17-20, 2023. pages 257-262, IEEE, 2023. [doi]
@inproceedings{LiWZZ23-2,
title = {Fast and High Precision Surface Defect Detection Method Based on New Label Assignment},
author = {Ruitao Li and Xiaojun Wu and Jinghui Zhou and Jiarui Zheng},
year = {2023},
doi = {10.1109/RCAR58764.2023.10249914},
url = {https://doi.org/10.1109/RCAR58764.2023.10249914},
researchr = {https://researchr.org/publication/LiWZZ23-2},
cites = {0},
citedby = {0},
pages = {257-262},
booktitle = {IEEE International Conference on Real-time Computing and Robotics, RCAR 2023, Datong, China, July 17-20, 2023},
publisher = {IEEE},
isbn = {979-8-3503-2718-2},
}