Ruitao Li, Xiaojun Wu, Jinghui Zhou, Jiarui Zheng. Fast and High Precision Surface Defect Detection Method Based on New Label Assignment. In IEEE International Conference on Real-time Computing and Robotics, RCAR 2023, Datong, China, July 17-20, 2023. pages 257-262, IEEE, 2023. [doi]
Abstract is missing.