Jia Li, Qiang Xu, Yu Hu, Xiaowei Li. Channel Width Utilization Improvement in Testing NoC-Based Systems for Test Time Reduction. In 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008, Hong Kong, January 23-25, 2008. pages 26-31, IEEE Computer Society, 2008. [doi]
@inproceedings{LiXHL08:1,
title = {Channel Width Utilization Improvement in Testing NoC-Based Systems for Test Time Reduction},
author = {Jia Li and Qiang Xu and Yu Hu and Xiaowei Li},
year = {2008},
doi = {10.1109/DELTA.2008.29},
url = {http://doi.ieeecomputersociety.org/10.1109/DELTA.2008.29},
tags = {rule-based, testing},
researchr = {https://researchr.org/publication/LiXHL08%3A1},
cites = {0},
citedby = {0},
pages = {26-31},
booktitle = {4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008, Hong Kong, January 23-25, 2008},
publisher = {IEEE Computer Society},
}