Jia Li, Qiang Xu, Yu Hu, Xiaowei Li. Channel Width Utilization Improvement in Testing NoC-Based Systems for Test Time Reduction. In 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008, Hong Kong, January 23-25, 2008. pages 26-31, IEEE Computer Society, 2008. [doi]
Abstract is missing.