X-Filling for Simultaneous Shift- and Capture-Power Reduction in At-Speed Scan-Based Testing

Jia Li, Qiang Xu, Yu Hu, Xiaowei Li. X-Filling for Simultaneous Shift- and Capture-Power Reduction in At-Speed Scan-Based Testing. IEEE Trans. VLSI Syst., 18(7):1081-1092, 2010. [doi]

Abstract

Abstract is missing.