The following publications are possibly variants of this publication:
- Corrigendum to "WDP-BNN: Efficient wafer defect pattern classification via binarized neural network" [Integration 85 (2022) 76-86]Qing Zhang, Yuhang Zhang, Jizuo Li, Yongfu Li 0002. integration, 88:10, 2023. [doi]
- WDP-BNN: Efficient wafer defect pattern classification via binarized neural networkQing Zhang, Yuhang Zhang, Jizuo Li, Yongfu Li. integration, 85:76-86, 2022. [doi]