Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Qing Zhang, Yuhang Zhang, Jizuo Li, Yongfu Li 0002. Corrigendum to "WDP-BNN: Efficient wafer defect pattern classification via binarized neural network" [Integration 85 (2022) 76-86]. Integration, 88:10, 2023. [doi]
Abstract is missing.