Corrigendum to "WDP-BNN: Efficient wafer defect pattern classification via binarized neural network" [Integration 85 (2022) 76-86] - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Qing Zhang, Yuhang Zhang, Jizuo Li, Yongfu Li 0002. Corrigendum to "WDP-BNN: Efficient wafer defect pattern classification via binarized neural network" [Integration 85 (2022) 76-86]. Integration, 88:10, 2023. [doi]

This author has not been identified. Look up 'Qing Zhang' in GoogleThis author has not been identified. Look up 'Yuhang Zhang' in GoogleThis author has not been identified. Look up 'Jizuo Li' in GoogleThis author has not been identified. Look up 'Yongfu Li 0002' in Google

runs on WebDSL