Qing Zhang, Yuhang Zhang, Jizuo Li, Yongfu Li 0002. Corrigendum to "WDP-BNN: Efficient wafer defect pattern classification via binarized neural network" [Integration 85 (2022) 76-86]. Integration, 88:10, 2023. [doi]
@article{ZhangZLL23,
title = {Corrigendum to "WDP-BNN: Efficient wafer defect pattern classification via binarized neural network" [Integration 85 (2022) 76-86]},
author = {Qing Zhang and Yuhang Zhang and Jizuo Li and Yongfu Li 0002},
year = {2023},
doi = {10.1016/j.vlsi.2022.09.001},
url = {https://doi.org/10.1016/j.vlsi.2022.09.001},
researchr = {https://researchr.org/publication/ZhangZLL23},
cites = {0},
citedby = {0},
journal = {Integration},
volume = {88},
pages = {10},
}