Qiao Li 0001, Min Ye, Yufei Cui, Tianyu Ren, Tei-Wei Kuo, Chun Jason Xue. Resolving the Reliability Issues of Open Blocks for 3-D NAND Flash: Observations and Strategies. IEEE Trans. on CAD of Integrated Circuits and Systems, 41(11):4076-4087, 2022. [doi]
@article{LiYCRKX22,
title = {Resolving the Reliability Issues of Open Blocks for 3-D NAND Flash: Observations and Strategies},
author = {Qiao Li 0001 and Min Ye and Yufei Cui and Tianyu Ren and Tei-Wei Kuo and Chun Jason Xue},
year = {2022},
doi = {10.1109/TCAD.2022.3197487},
url = {https://doi.org/10.1109/TCAD.2022.3197487},
researchr = {https://researchr.org/publication/LiYCRKX22},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {41},
number = {11},
pages = {4076-4087},
}