Qiao Li 0001, Min Ye, Yufei Cui, Tianyu Ren, Tei-Wei Kuo, Chun Jason Xue. Resolving the Reliability Issues of Open Blocks for 3-D NAND Flash: Observations and Strategies. IEEE Trans. on CAD of Integrated Circuits and Systems, 41(11):4076-4087, 2022. [doi]
Abstract is missing.