Intelligent Device Parameter Extraction for Nanoscale MOSFETs Era

Yiming Li, Shao-Ming Yu, Hsiao-Mei Lu. Intelligent Device Parameter Extraction for Nanoscale MOSFETs Era. In Hamid R. Arabnia, Laurence Tianruo Yang, editors, Proceedings of the International Conference on VLSI, VLSI 03, June 23 - 26, 2003, Las Vegas, Nevada, USA. pages 233-239, CSREA Press, 2003.

Abstract

Abstract is missing.