Dynamic self-test scheme and authentication protocol for improving robustness of strong PUF - researchr publication authors

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Yan Li, Weifeng Yang, Jiang Li, Yanfang Yuan, Hu Zhang, Fengdi Wang, Yijun Cui. Dynamic self-test scheme and authentication protocol for improving robustness of strong PUF. Microelectronics Journal, 139:105864, September 2023. [doi]

This author has not been identified. Look up 'Yan Li' in GoogleThis author has not been identified. Look up 'Weifeng Yang' in GoogleThis author has not been identified. Look up 'Jiang Li' in GoogleThis author has not been identified. Look up 'Yanfang Yuan' in GoogleThis author has not been identified. Look up 'Hu Zhang' in GoogleThis author has not been identified. Look up 'Fengdi Wang' in GoogleThis author has not been identified. Look up 'Yijun Cui' in Google

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