Yan Li, Weifeng Yang, Jiang Li, Yanfang Yuan, Hu Zhang, Fengdi Wang, Yijun Cui. Dynamic self-test scheme and authentication protocol for improving robustness of strong PUF. Microelectronics Journal, 139:105864, September 2023. [doi]
@article{LiYLYZWC23,
title = {Dynamic self-test scheme and authentication protocol for improving robustness of strong PUF},
author = {Yan Li and Weifeng Yang and Jiang Li and Yanfang Yuan and Hu Zhang and Fengdi Wang and Yijun Cui},
year = {2023},
month = {September},
doi = {10.1016/j.mejo.2023.105864},
url = {https://doi.org/10.1016/j.mejo.2023.105864},
researchr = {https://researchr.org/publication/LiYLYZWC23},
cites = {0},
citedby = {0},
journal = {Microelectronics Journal},
volume = {139},
pages = {105864},
}