Bao Li, Long Zhao, Yuhua Cheng. Auxiliary testability design schemes for CMOS DACs with ultrahigh sampling rates. In Yajie Qin, Zhiliang Hong, Ting-Ao Tang, editors, 12th IEEE International Conference on ASIC, ASICON 2017, Guiyang, China, October 25-28, 2017. pages 36-39, IEEE, 2017. [doi]
Abstract is missing.