A New and Quick Approach to the Fault-Detection of High-Voltage Wires Based on Infrered Image Analysis - researchr publication authors

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Xiabin Li, Guifang Zhen, Huazhi Liu. A New and Quick Approach to the Fault-Detection of High-Voltage Wires Based on Infrered Image Analysis. In Proceedings of IAPR Workshop on Computer Vision - Special Hardware and Industrial Applications, MVA 1988, Tokyo, Japan, October 12-14, 1988. pages 157-160, 1988. [doi]

This author has not been identified. Look up 'Xiabin Li' in GoogleThis author has not been identified. Look up 'Guifang Zhen' in GoogleThis author has not been identified. Look up 'Huazhi Liu' in Google

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