Xiabin Li, Guifang Zhen, Huazhi Liu. A New and Quick Approach to the Fault-Detection of High-Voltage Wires Based on Infrered Image Analysis. In Proceedings of IAPR Workshop on Computer Vision - Special Hardware and Industrial Applications, MVA 1988, Tokyo, Japan, October 12-14, 1988. pages 157-160, 1988. [doi]
Abstract is missing.