Xiabin Li, Guifang Zhen, Huazhi Liu. A New and Quick Approach to the Fault-Detection of High-Voltage Wires Based on Infrered Image Analysis. In Proceedings of IAPR Workshop on Computer Vision - Special Hardware and Industrial Applications, MVA 1988, Tokyo, Japan, October 12-14, 1988. pages 157-160, 1988. [doi]
@inproceedings{LiZL88,
title = {A New and Quick Approach to the Fault-Detection of High-Voltage Wires Based on Infrered Image Analysis},
author = {Xiabin Li and Guifang Zhen and Huazhi Liu},
year = {1988},
url = {http://www.mva-org.jp/Proceedings/CommemorativeDVD/1988/papers/1988157.pdf},
researchr = {https://researchr.org/publication/LiZL88},
cites = {0},
citedby = {0},
pages = {157-160},
booktitle = {Proceedings of IAPR Workshop on Computer Vision - Special Hardware and Industrial Applications, MVA 1988, Tokyo, Japan, October 12-14, 1988},
}