Automatic functional test program generation for microprocessor verification

Tun Li, Dan Zhu, Lei Liang, Yang Guo, Sikun Li. Automatic functional test program generation for microprocessor verification. In Ting-Ao Tang, editor, Proceedings of the 2005 Conference on Asia South Pacific Design Automation, ASP-DAC 2005, Shanghai, China, January 18-21, 2005. pages 1039-1042, ACM Press, 2005. [doi]

Abstract

Abstract is missing.