Peng Li, Changlin Zhang, Lianqing Liu, Yuechao Wang, Ning Xi, Uchechukwu C. Wejinya, Guangyong Li. Prior knowledge based fast imaging for scanning ion conductance microscopy. In 2013 IEEE/ASME International Conference on Advanced Intelligent Mechatronics, Wollongong, Australia, July 9-12, 2013. pages 89-93, IEEE, 2013. [doi]
Abstract is missing.