Reliable Antifuse One-Time-Programmable Scheme With Charge Pump for Postpackage Repair of DRAM

Xian Li, Huicai Zhong, Zhenhui Tang, Cheng Jia. Reliable Antifuse One-Time-Programmable Scheme With Charge Pump for Postpackage Repair of DRAM. IEEE Trans. VLSI Syst., 23(9):1956-1960, 2015. [doi]

Abstract

Abstract is missing.