Dengquan Li, Yexin Zhu, Longsheng Wang, Shubin Liu, Zhangming Zhu. Low-Cost Linearity Testing of High-Resolution ADCs Using Segmentation Modeling and Partial Polynomial Fitting. In IEEE International Symposium on Circuits and Systems, ISCAS 2024, Singapore, May 19-22, 2024. pages 1-4, IEEE, 2024. [doi]
Abstract is missing.