Dark line detection with line width extraction

Qin Li, Lei Zhang, Jane You, David Zhang, Prabir Bhattacharya. Dark line detection with line width extraction. In Proceedings of the International Conference on Image Processing, ICIP 2008, October 12-15, 2008, San Diego, California, USA. pages 621-624, IEEE, 2008. [doi]

Authors

Qin Li

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Lei Zhang

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Jane You

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David Zhang

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Prabir Bhattacharya

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