Dark line detection with line width extraction

Qin Li, Lei Zhang, Jane You, David Zhang, Prabir Bhattacharya. Dark line detection with line width extraction. In Proceedings of the International Conference on Image Processing, ICIP 2008, October 12-15, 2008, San Diego, California, USA. pages 621-624, IEEE, 2008. [doi]

@inproceedings{LiZYZB08,
  title = {Dark line detection with line width extraction},
  author = {Qin Li and Lei Zhang and Jane You and David Zhang and Prabir Bhattacharya},
  year = {2008},
  doi = {10.1109/ICIP.2008.4711831},
  url = {http://dx.doi.org/10.1109/ICIP.2008.4711831},
  researchr = {https://researchr.org/publication/LiZYZB08},
  cites = {0},
  citedby = {0},
  pages = {621-624},
  booktitle = {Proceedings of the International Conference on Image Processing, ICIP 2008, October 12-15, 2008, San Diego, California, USA},
  publisher = {IEEE},
}