Shuai Liang, Mokrane Boudaoud, Catherine Achard, Weibin Rong, Stéphane Régnier. Atomic force microscope tip localization and tracking through deep learning based vision inside an electron microscope. In 2019 IEEE/RSJ International Conference on Intelligent Robots and Systems, IROS 2019, Macau, SAR, China, November 3-8, 2019. pages 2435-2440, IEEE, 2019. [doi]
Abstract is missing.