SAT-based analysis of large real-world feature models is easy

Jia Hui (Jimmy) Liang, Vijay Ganesh, Krzysztof Czarnecki, Venkatesh Raman. SAT-based analysis of large real-world feature models is easy. In Douglas C. Schmidt, editor, Proceedings of the 19th International Conference on Software Product Line, SPLC 2015, Nashville, TN, USA, July 20-24, 2015. pages 91-100, ACM, 2015. [doi]

Abstract

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