Improved Representatives for Unrepairability Judging and Economic Repair Solutions of Memories

Hsing-Chung Liang, Le-Quen Tzeng. Improved Representatives for Unrepairability Judging and Economic Repair Solutions of Memories. In 14th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2006), 2-4 August 2006, Taipei, Taiwan. pages 15, IEEE Computer Society, 2006. [doi]

Authors

Hsing-Chung Liang

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Le-Quen Tzeng

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