Hsing-Chung Liang, Le-Quen Tzeng. Improved Representatives for Unrepairability Judging and Economic Repair Solutions of Memories. In 14th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2006), 2-4 August 2006, Taipei, Taiwan. pages 15, IEEE Computer Society, 2006. [doi]
@inproceedings{LiangT06:0,
title = {Improved Representatives for Unrepairability Judging and Economic Repair Solutions of Memories},
author = {Hsing-Chung Liang and Le-Quen Tzeng},
year = {2006},
doi = {10.1109/MTDT.2006.18},
url = {http://doi.ieeecomputersociety.org/10.1109/MTDT.2006.18},
researchr = {https://researchr.org/publication/LiangT06%3A0},
cites = {0},
citedby = {0},
pages = {15},
booktitle = {14th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2006), 2-4 August 2006, Taipei, Taiwan},
publisher = {IEEE Computer Society},
isbn = {0-7695-2572-5},
}