Hsing-Chung Liang, Le-Quen Tzeng. Improved Representatives for Unrepairability Judging and Economic Repair Solutions of Memories. In 14th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2006), 2-4 August 2006, Taipei, Taiwan. pages 15, IEEE Computer Society, 2006. [doi]
Abstract is missing.