Guoning Liao. Error detection, fault location and reconfiguration for 2D mesh processing element arrays for digital signal processing. In 11th IEEE VLSI Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993, Atlantic City, NJ, USA. pages 55-61, IEEE, 1993. [doi]
@inproceedings{Liao93-0, title = {Error detection, fault location and reconfiguration for 2D mesh processing element arrays for digital signal processing}, author = {Guoning Liao}, year = {1993}, doi = {10.1109/VTEST.1993.313308}, url = {http://dx.doi.org/10.1109/VTEST.1993.313308}, researchr = {https://researchr.org/publication/Liao93-0}, cites = {0}, citedby = {0}, pages = {55-61}, booktitle = {11th IEEE VLSI Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993, Atlantic City, NJ, USA}, publisher = {IEEE}, isbn = {0-8186-3830-3}, }