Error detection, fault location and reconfiguration for 2D mesh processing element arrays for digital signal processing

Guoning Liao. Error detection, fault location and reconfiguration for 2D mesh processing element arrays for digital signal processing. In 11th IEEE VLSI Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993, Atlantic City, NJ, USA. pages 55-61, IEEE, 1993. [doi]

Abstract

Abstract is missing.