Yi-Bo Liao, Meng-Hsueh Chiang, Keunwoo Kim, Wei-Chou Hsu. Assessment of structure variation in silicon nanowire FETs and impact on SRAM. Microelectronics Journal, 43(5):300-304, 2012. [doi]
@article{LiaoCKH12,
title = {Assessment of structure variation in silicon nanowire FETs and impact on SRAM},
author = {Yi-Bo Liao and Meng-Hsueh Chiang and Keunwoo Kim and Wei-Chou Hsu},
year = {2012},
doi = {10.1016/j.mejo.2011.12.002},
url = {http://dx.doi.org/10.1016/j.mejo.2011.12.002},
researchr = {https://researchr.org/publication/LiaoCKH12},
cites = {0},
citedby = {0},
journal = {Microelectronics Journal},
volume = {43},
number = {5},
pages = {300-304},
}