Assessment of structure variation in silicon nanowire FETs and impact on SRAM

Yi-Bo Liao, Meng-Hsueh Chiang, Keunwoo Kim, Wei-Chou Hsu. Assessment of structure variation in silicon nanowire FETs and impact on SRAM. Microelectronics Journal, 43(5):300-304, 2012. [doi]

Abstract

Abstract is missing.