Fault Coverage Analysis for Physically-Based CMOS Bridging Faults at Different Power Supply Voltages - researchr publication authors

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Yuyun Liao, D. M. H. Walker. Fault Coverage Analysis for Physically-Based CMOS Bridging Faults at Different Power Supply Voltages. In Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. pages 767-775, IEEE Computer Society, 1996.

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