Yuyun Liao, D. M. H. Walker. Fault Coverage Analysis for Physically-Based CMOS Bridging Faults at Different Power Supply Voltages. In Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. pages 767-775, IEEE Computer Society, 1996.
@inproceedings{LiaoW96,
title = {Fault Coverage Analysis for Physically-Based CMOS Bridging Faults at Different Power Supply Voltages},
author = {Yuyun Liao and D. M. H. Walker},
year = {1996},
tags = {analysis, coverage},
researchr = {https://researchr.org/publication/LiaoW96},
cites = {0},
citedby = {0},
pages = {767-775},
booktitle = {Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996},
publisher = {IEEE Computer Society},
isbn = {0-7803-3541-4},
}