Machine learning based prediction model for single event burnout hardening design of power MOSFETs - researchr publication authors

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Xinfang Liao, Changqing Xu, Yi Liu 0060, Chen Wang, Dongdong Chen 0010, Yintang Yang. Machine learning based prediction model for single event burnout hardening design of power MOSFETs. Microelectronics Journal, 139:105893, September 2023. [doi]

This author has not been identified. Look up 'Xinfang Liao' in GoogleThis author has not been identified. Look up 'Changqing Xu' in GoogleThis author has not been identified. Look up 'Yi Liu 0060' in GoogleThis author has not been identified. Look up 'Chen Wang' in GoogleThis author has not been identified. Look up 'Dongdong Chen 0010' in GoogleThis author has not been identified. Look up 'Yintang Yang' in Google

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