Machine learning based prediction model for single event burnout hardening design of power MOSFETs

Xinfang Liao, Changqing Xu, Yi Liu 0060, Chen Wang, Dongdong Chen 0010, Yintang Yang. Machine learning based prediction model for single event burnout hardening design of power MOSFETs. Microelectronics Journal, 139:105893, September 2023. [doi]

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