An Efficient On-Chip Test Generation Scheme Based on Programmable and Multiple Twisted-Ring Counters

Wei-Cheng Lien, Kuen-Jong Lee, Tong-Yu Hsieh, Wee-Lung Ang. An Efficient On-Chip Test Generation Scheme Based on Programmable and Multiple Twisted-Ring Counters. IEEE Trans. on CAD of Integrated Circuits and Systems, 32(8):1254-1264, 2013. [doi]

Authors

Wei-Cheng Lien

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Kuen-Jong Lee

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Tong-Yu Hsieh

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Wee-Lung Ang

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