Wei-Cheng Lien, Kuen-Jong Lee, Tong-Yu Hsieh, Wee-Lung Ang. An Efficient On-Chip Test Generation Scheme Based on Programmable and Multiple Twisted-Ring Counters. IEEE Trans. on CAD of Integrated Circuits and Systems, 32(8):1254-1264, 2013. [doi]
@article{LienLHA13,
title = {An Efficient On-Chip Test Generation Scheme Based on Programmable and Multiple Twisted-Ring Counters},
author = {Wei-Cheng Lien and Kuen-Jong Lee and Tong-Yu Hsieh and Wee-Lung Ang},
year = {2013},
doi = {10.1109/TCAD.2013.2253155},
url = {http://dx.doi.org/10.1109/TCAD.2013.2253155},
researchr = {https://researchr.org/publication/LienLHA13},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {32},
number = {8},
pages = {1254-1264},
}