Michael R. Lightner, Gary D. Hachtel. Implication algorithms for MOS switch level functional macromodeling implication and testing. In James S. Crabbe, Charles E. Radke, Hillel Ofek, editors, Proceedings of the 19th Design Automation Conference, DAC '82, Las Vegas, Nevada, USA, June 14-16, 1982. pages 691-698, ACM/IEEE, 1982. [doi]
@inproceedings{LightnerH82,
title = {Implication algorithms for MOS switch level functional macromodeling implication and testing},
author = {Michael R. Lightner and Gary D. Hachtel},
year = {1982},
doi = {10.1145/800263.809277},
url = {http://doi.acm.org/10.1145/800263.809277},
researchr = {https://researchr.org/publication/LightnerH82},
cites = {0},
citedby = {0},
pages = {691-698},
booktitle = {Proceedings of the 19th Design Automation Conference, DAC '82, Las Vegas, Nevada, USA, June 14-16, 1982},
editor = {James S. Crabbe and Charles E. Radke and Hillel Ofek},
publisher = {ACM/IEEE},
isbn = {0-89791-020-6},
}