Jongyup Lim, Tae-Kwang Jang, Mehdi Saligane, Makoto Yasuda, Satoru Miyoshi, Masaru Kawaminami, David T. Blaauw, Dennis Sylvester. A 224 PW 260 PPM/°C Gate-Leakage-Based Timer for Ultra-Low Power Sensor Nodes with Second-Order Temperature Dependency Cancellation. In 2018 IEEE Symposium on VLSI Circuits, Honolulu, HI, USA, June 18-22, 2018. pages 117-118, IEEE, 2018. [doi]
@inproceedings{LimJSYMKBS18,
title = {A 224 PW 260 PPM/°C Gate-Leakage-Based Timer for Ultra-Low Power Sensor Nodes with Second-Order Temperature Dependency Cancellation},
author = {Jongyup Lim and Tae-Kwang Jang and Mehdi Saligane and Makoto Yasuda and Satoru Miyoshi and Masaru Kawaminami and David T. Blaauw and Dennis Sylvester},
year = {2018},
doi = {10.1109/VLSIC.2018.8502374},
url = {https://doi.org/10.1109/VLSIC.2018.8502374},
researchr = {https://researchr.org/publication/LimJSYMKBS18},
cites = {0},
citedby = {0},
pages = {117-118},
booktitle = {2018 IEEE Symposium on VLSI Circuits, Honolulu, HI, USA, June 18-22, 2018},
publisher = {IEEE},
isbn = {978-1-5386-4214-6},
}