Jongyup Lim, Tae-Kwang Jang, Mehdi Saligane, Makoto Yasuda, Satoru Miyoshi, Masaru Kawaminami, David T. Blaauw, Dennis Sylvester. A 224 PW 260 PPM/°C Gate-Leakage-Based Timer for Ultra-Low Power Sensor Nodes with Second-Order Temperature Dependency Cancellation. In 2018 IEEE Symposium on VLSI Circuits, Honolulu, HI, USA, June 18-22, 2018. pages 117-118, IEEE, 2018. [doi]
Abstract is missing.